The modular design of the WITec microscope systems allows to combine various imaging techniques such as Raman imaging, fluorescence, luminescence, atomic force microscopy (AFM), near-field microscopy (SNOM or NSOM) and scanning electron microscopy in one single instrument without compromising the analyzing and imaging quality.
The integrated WITec software interface enables user-friendly measurement control, quick and easy correlation of the results and image overlay.
The Raman-SEM (RISE) combination is a unique correlative microscopy technique provided by WITec. Structures in the nm-range detected by Scanning Electron Microscopy (SEM) can be correlated to chemical Raman imaging from the same sample area.
By combining confocal Raman imaging with AFM, the chemical composition of the sample can be linked with the surface characteristics. These two complementary techniques are available in combined Raman-AFM WITec microscopes for flexible and comprehensive sample characterization.
More information about WITec's Raman-AFM Microscope alpha300 RA
Combining Raman characterization with SNOM for optical imaging beyond the diffraction limit provides informative results for even challenging experimental requirement.
More information about WITec's Raman-SNOM Microscope alpha300 RS
One-pass topographic Raman Imaging (TrueSurface Microscopy) for operations on rough or inclined samples.
More information about WITec's Profilometry Microscopy TrueSurface